1. Automatic testing and evalustion of digital integrated circuits
Author: Healy, James Thomas
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing ، Digital integrated circuits,، Automatic checkout equipment
Classification :
TK
7874
.
H395
2. Neural models and algorithms for digital testing
Author: Chakradhar, Srimat T.
Library: Library of Niroo Research Institue (Tehran)
Subject: ، Logic circuits- Testing,، Automatic checkout equipment,، Digital integrated circuits- Testing- Data processing
3. Neural models and algorithms for digital testing
Author: / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Logic circuits - Testing,Automatic checkout equipment,Digital integrated circuits - Testing - Data processing
Classification :
TK
7868
.
L6C44
1991
4. Testability concepts for digital ICs : the macro test approach
Author: Beenker, F. P. M.)Frans P. M.(
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Digital integrated circuits-- Testing,، Automatic checkout equipment
Classification :
TK
7874
.
65
.
B44
1996
5. Testability concepts for digital ICs : the macro test approach
Author: Beenker, Frans P. M.
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Digital integrated circuits - Testing , Automatic checkout equipment
Classification :
TK
7874
.
65
.
B44
1995
